The Michigan Engineer News Center

View into the Nanoworld

A photograph of a Ultra High Vacuum Scanning Thermal Microscope.

Kyongtae Kim, Research Fellow, uses the Ultra High Vacuum Scanning Thermal Microscope (UHV-SthM) to measure temperature of samples at the nano scale in the GG Brown Addition. The instrument will soon be moved to the ultra low-vibration chamber in the GG Brown Addition that will enable to ultra precision in a controlled environment that researchers previously did not have access to. Photo: Joseph Xu, Michigan Engineering Communications & Marketing