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Professor Judy Jin receives funding from Samsung

Title: Optimizing Reliability Tests for Display by Integrating Reliability Analysis of Field Failure Data| Short Read

Title: Optimizing Reliability Tests for Display by Integrating Reliability Analysis of Field Failure Data

Funding Source: Samsung

Project description: This one year research project aims to develop a systematic method to improve LCD display reliability tests through integrating field failure data analysis. It will also enhance the understanding of failure modes of LCD display and provide better reliability modeling and prediction to reduce unexpected failures during field operations.

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Amanda Godwin
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MORPHEUS blocks potential attacks by encrypting and randomly reshuffling key bits of its own code and data twenty times per second. Getty Images.

New chip stops hacks before they start

MORPHEUS can encrypt and reshuffle code thousands of times faster than human and electronic hackers. | Medium Read