The Michigan Engineer News Center

Professor Judy Jin receives funding from Samsung

by Rod Capps
Industrial and Operations Engineering
February 20, 2018
Title: Optimizing Reliability Tests for Display by Integrating Reliability Analysis of Field Failure Data| Short Read

Title: Optimizing Reliability Tests for Display by Integrating Reliability Analysis of Field Failure Data

Funding Source: Samsung

Project description: This one year research project aims to develop a systematic method to improve LCD display reliability tests through integrating field failure data analysis. It will also enhance the understanding of failure modes of LCD display and provide better reliability modeling and prediction to reduce unexpected failures during field operations.

Portrait of Amanda Godwin

Contact

Amanda Godwin
Administrative Assistant

Industrial & Operations Engineering

(734) 764-6473

1891 IOE

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Campus & Community

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Faculty Perspectives
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In the News
The Wall Street Journal June 18, 2018
Can ultrasonic noise make you sick?
Kevin Fu, associate EECS professor, and his team showed how ultrasonic signals can combine to produce audible and potentially dangerous tones similar to the ones that the diplomats described.
Time June 13, 2018
Net Neutrality is officially dead. Here’s how the changes could affect you, according to experts
Florian Schaub, assistant EECS professor, is quoted.
Scientific American June 11, 2018
Could connected cars pose a new threat to smart cities?
Z Morley Mao, EECS professor, co-wrote the article with EECS PhD candidate Qi Alfred Chen.
CBC May 29, 2018
Mysterious brain injuries at embassies may be linked to common ultrasonic devices
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